Classification On Mixedwm38
指标
Accuracy
MCC
结果
各模型在此基准测试上的性能结果
| 论文标题 | 代码 | |||
|---|---|---|---|---|
| WaferSegClassNet | 0.9820 | 0.9815 | WaferSegClassNet -- A Light-weight Network for Classification and Segmentation of Semiconductor Wafer Defects |
0 of 1 row(s) selected.
各模型在此基准测试上的性能结果
| 论文标题 | 代码 | |||
|---|---|---|---|---|
| WaferSegClassNet | 0.9820 | 0.9815 | WaferSegClassNet -- A Light-weight Network for Classification and Segmentation of Semiconductor Wafer Defects |
各模型在此基准测试上的性能结果
| 论文标题 | 代码 | |||
|---|---|---|---|---|
| WaferSegClassNet | 0.9820 | 0.9815 | WaferSegClassNet -- A Light-weight Network for Classification and Segmentation of Semiconductor Wafer Defects |